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NCFL Equipment and Capabilities

  • JEOL JEM ARM200f NEOARM: COMING in 2024 – Atomic resolution scanning/transmission electron microscope equipped with Cold-FEG, automated aberration correction, and EDS
  • JEOL JEM 2100: Analytical scanning/transmission electron microscope equipped with EDS
  • Philips EM420:  Low Energy – high contrast transmission electron microscope  
  • JEOL IT-500HR analytical FEG SEM offering a seamless link from optical to high magnification SEM images and automated large area imaging and spectroscopy analyses
  • FEI Quanta 600 FEG Environmental SEM equipped with EDS, heating stage, mechanical testing fixture
  • Helios 5 UC: A dual-beam workstation equipped with EDS and EBSD
  • WITec alpha 500: Confocal Raman Microscope
  • Agilent Cary 5000: UV-Vis-NIR spectrophotometer
  • Bruker Multimode AFM: Atomic force microscope
  • Malvern Zetasizer Nano ZS: Dynamic light scattering particle size analyzer
  • Quantachrome AUTOSORB-1: BET surface area measurements
  • Gatan PIPS II: Precision ion polishing system
  • Gatan Solarus II: Plasma cleaning tool
  • Leica EM TIC 3X: Ion beam milling system
  • RMC Boeckeler PowerTome PC: Cryo-ultramicrotome