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NCFL Equipment and Capabilities

  • TEM: Transmission Electron Microscopy
    • FEI Titan 300:  Field-emission scanning TEM equipped with HAADF, EDS, and EELS
    • JEOL JEM 2100: Thermal emitter (LaB6) scanning TEM equipped with HAADF and EDS
    • Philips EM420:  Thermal emitter (LaB6) TEM
  • SEM: Scanning Electron Microscopy
  • FIB: Focused Ion Beam, Dual-Beam Workstation
  • Vibrational Spectroscopy
    • WITec alpha500: Raman Confocal AFM
    • Cary 5000 UV-Vis-NIR: Ultraviolet, visible, near-infrared spectrophotometer
    • PHI Quantera SXM: X-ray photoelectron spectrometer
    • Cameca IMS 7f GEO: Secondary ion mass spectrometer
  • Scanning Probe, Optical, and Surface Analysis
    • Bruker Multimode AFM: Atomic force microscope
    • Malvern Zetasizer Nano ZS: Dynamic light scattering particle size analyzer
    • Quantachrome AUTOSORB-1: BET surface area measurements
    • Hysitron TriboIndenter: nanomechanical test instrument
    • HIROX KH-7700: 3D Digital Video Microscope
  • Specimen Preparation Equipment
    • Gatan PIPS II: Precision ion polishing system
    • Gatan Solarus II: Plasma cleaning tool
    • Leica EM TIC 3X: Ion beam milling system
    • RMC Boeckeler PowerTome PC: Cryo-ultramicrotome