Instruments
NCFL Equipment and Capabilities
- JEOL JEM ARM200f NEOARM: COMING in 2024 – Atomic resolution scanning/transmission electron microscope equipped with Cold-FEG, automated aberration correction, and EDS
- JEOL JEM 2100: Analytical scanning/transmission electron microscope equipped with EDS
- Philips EM420: Low Energy – high contrast transmission electron microscope
- JEOL IT-500HR analytical FEG SEM offering a seamless link from optical to high magnification SEM images and automated large area imaging and spectroscopy analyses
- FEI Quanta 600 FEG Environmental SEM equipped with EDS, heating stage, mechanical testing fixture
- LEO (Zeiss) 1550 Field Emission SEM equipped with EDS and EBSD
- FEI Helios 600 NanoLab: A dual-beam workstation equipped with EDS and EBSD
- WITec alpha 500: Confocal Raman Microscope
- Agilent Cary 5000: UV-Vis-NIR spectrophotometer
- PHI Quantera Hybrid: X-ray photoelectron spectrometer (XPS)
- Bruker Multimode AFM: Atomic force microscope
- Malvern Zetasizer Nano ZS: Dynamic light scattering particle size analyzer
- Quantachrome AUTOSORB-1: BET surface area measurements
- Hysitron TriboIndenter: nanomechanical test instrument
- HIROX KH-7700: 3D Digital Video Microscope
- Gatan PIPS II: Precision ion polishing system
- Gatan Solarus II: Plasma cleaning tool
- Leica EM TIC 3X: Ion beam milling system
- RMC Boeckeler PowerTome PC: Cryo-ultramicrotome