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FEI Titan 300

Titan FEI 300

The FEI TITAN 80-300 is an analytical transmission electron microscope using a Schottky filed emission electron source. This TEM was installed in 2005 as one of the first twenty TITANs distributed in the world. In 2010, Profs. Hochella (Geos. Emeritus) and Murayama (MSE) were awarded a $0.5M DOE-BES Geosciences supplemental equipment funding (award for DE-FG02-06ER15786) for fully upgrading this TEM, enabling 300kV operation and adding advanced nanoprobe electron diffraction pattern recording capabilities.    

  • Gatan Orius 833 CCD camera (2048 × 2048 pixels) for recording images, electron diffraction patterns and in-situ movies (up to 60fps);
  • Gatan Imaging Filter (GIF) Tridiem 863 for electron energy loss spectroscopy (EELS) and energy filtered imaging (EF-TEM);
  • Gatan STEM Spectrum-Imaging software package;
  • Gatan Digital Micrograph ver. 2.11 (GMS-II);
  • Gatan 794 Multi Scan CCD (1024 × 1024, 14bit) for high resolution imaging;
  • E.A. Fischione model 3000 Annular Dark Field Detector for STEM imaging;
  • FEI Micro-Probe STEM (mP-STEM) mode;
  • FEI Xplore3D Electron Tomography Acquisition software;
  • Spatial resolution 
    • TEM Point-to-Point 0.20nm
    • TEM Line                    0.12nm
    • STEM HAADF            0.136nm

Typical applications for this instrument are:

  • Atomic-level imaging and analysis of nanomaterials and nanoparticles
  • Nano-scale electron diffraction and electron energy loss spectroscopy  
  • Characterization of inorganic materials’ (metals, ceramics, minerals, semiconductors) defect structures and interfaces
  • Characterization of submicroscopic microstructures of structural materials
  • Advanced imaging (Electron Tomography, Spectrum imaging)

The TEM is used for research/research education and access to this TEM is limited to experienced users. Users can be trained to operate this instrument after become proficient in the TEM and STEM operation on JEM-2100.

  • Maximum sample size: 3-mm diameter, 150 µm thick (including TEM specimen grid) and materials must be high vacuum compatible.
  • Observation area needs to be thin (typically thinner than 100nm and less than 50nm for atomic resolution imaging and accurate spectroscopy), and mechanically and structurally stable under the intense high energy electron beam.
  • Biomaterials must be biosafety level 0 (BSL-0) or BSL-1 already prepared on a TEM grid. Toxic or potentially infectious biomaterials are not allowed.
  • No EDS capability on this TEM.
  • FEI Inspect3D tomography reconstruction package license has been expired.

Sample Images

Titan sample
TEM Micrograph of several AlZr3 precipitates in an aluminum alloy. Popcorn-shaped precipitates form at 375 degrees C and are responsible for increasing the strength of the alloy. Each precipitate is roughly 15 nanometers across. Image courtesy of Joerg Jinschek, Bill Reynolds, Vincent Caluori, Kristine Obusek, and Keith Knipling.
sample titan1
A high-resolution electron microscope image of nanometer-sized twins in Ni-Fe-Ga ferromagnetic shape-memory alloy. Image courtesy of Joerg Jinschek and Bill Reynolds.