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LEO (Zeiss) 1550


The LEO (Zeiss) 1550 is a high-performance Schottky field-emission SEM capable of resolution in 2-5 nm size range. It is used for high-resolution imaging of surfaces, qualitative assessment of the distribution of elements (with atomic numbers between boron and uranium), submicron structure analysis, and determination of crystal orientation and crystalline texture.

The NCFL’s LEI (Zeiss) 1550 is equipped with:

  • In-lens secondaryelectron and Robinson-type back-scatter electron detectors.
  • Oxford INCA Energy E2H X-ray Energy Dispersive Spectrometer (EDS) system with Silicon Drifted detector
  • HKL Nordlys II Electron Back Scatter Diffraction (EBSD) system, including a Forward Scatter Electron (FSE) detector

Sample Images

Sample fesem01
Spherulite crystallization in an amorphous polymer melt. Image courtesy of Steve McCartney.
Sample fesem02
Porous gold formed by dealloying a silver gold mixture electrochemically and then annealing at 1073K for 15 minutes to increase the pore size. Image courtesy of Aziz Dursan and Steve McCartney.
Sample fesem03
Long-stemmed rose patterned in silicon with electron beam lithography. Rose is about 25 microns long. Image courtesy of Steve McCartney.
Sample fesem04
Cool little fractal crystals of something or other. Image courtesy Steve McCartney.