Equipment

NCFL Equipment and Capabilities

• TEM: Transmission Electron Microscopy
  • FEI TITAN 80-300:  FEG scanning/transmission electron microscope equipped with HAADF and EELS
  • JEOL JEM 2100: Analytical scanning/transmission electron microscope equipped with EDS
  • Philips EM420:  Low Energy – high contrast transmission electron microscope 
• SEM: Scanning Electron Microscopy
  • JEOL IT-500HR analytical FEG SEM offering a seamless link from optical to high magnification SEM images and automated large area imaging and spectroscopy analyses
    
  • FEI Quanta 600 FEG Environmental SEM equipped with EDS, heating stage, mechanical testing fixture
  • LEO (Zeiss) 1550 Field Emission SEM equipped with EDS and EBSD
• FIB: Focused Ion Beam, Dual-Beam Workstation
  • FEI Helios 600 NanoLab: A dual-beam workstation equipped with EDS and EBSD
• Vibrational Spectroscopy
  • WITec alpha500: Raman Confocal AFM
  • Cary 5000 UV-Vis-NIR: Ultraviolet, visible, near-infrared spectrophotometer
  • PHI Quantera SXM: X-ray photoelectron spectrometer
  • Cameca IMS 7f GEO: Secondary ion mass spectrometer
• Scanning Probe, Optical, and Surface Analysis
  • Bruker Multimode AFM: Atomic force microscope
  • Malvern Zetasizer Nano ZS: Dynamic light scattering particle size analyzer
  • Quantachrome AUTOSORB-1: BET surface area measurements
  • Hysitron TriboIndenter: nanomechanical test instrument
  • HIROX KH-7700: 3D Digital Video Microscope
• Specimen Preparation Equipment
  • Gatan PIPS II: Precision ion polishing system
  • Gatan Solarus II: Plasma cleaning tool
  • Leica EM TIC 3X: Ion beam milling system
  • RMC Boeckeler PowerTome PC: Cryo-ultramicrotome