The LEO (Zeiss) 1550 is a high-performance Schottky field-emission SEM capable of resolution in 2-5 nm size range. It is used for high-resolution imaging of surfaces, qualitative assessment of the distribution of elements (with atomic numbers between boron and uranium), submicron structure analysis, and determination of crystal orientation and crystalline texture.
The NCFL’s LEI (Zeiss) 1550 is equipped with:
- In-lens secondaryelectron and Robinson-type back-scatter electron detectors.
- Oxford INCA Energy E2H X-ray Energy Dispersive Spectrometer (EDS) system with Silicon Drifted detector
- HKL Nordlys II Electron Back Scatter Diffraction (EBSD) system, including a Forward Scatter Electron (FSE) detector